Search

Search Constraints

Start Over You searched for: Degree PHD Remove constraint Degree: PHD Keyword Reliability Remove constraint Keyword: Reliability Keyword Reliability Remove constraint Keyword: Reliability

Search Results

1. Exploring Power Reliability Tradeoffs in On-Chip Networks

open_access
Open Access

2. Redundancy and Parallelism Tradeoffs for Reliable, High-Performance Architectures

open_access
Open Access

3. Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs

open_access
Open Access

4. DESIGNING ENERGY-EFFICIENT AND RELIABLE CACHES AND INTERCONNECTS

open_access
Open Access

5. The Disability in the Physically Active Scale: The Psychometrics of an Outcome Scale for Musculoskeletal Injuries

open_access
Open Access

6. Addressing Reliability Issues in Performance-Critical Processor Structures

open_access
Open Access

7. Analysis of Failures in Nanoscale Devices

open_access
Open Access

8. Software Based Techniques for Robust Computing on Chip Multiprocessors

open_access
Open Access

10. LOAD AND RESISTANCE FACTOR DESIGN FOR INTEGRAL ABUTMENT BRIDGES

open_access
Open Access

11. A Citation-Based Assessment Of The Performance Of U.S. Boiling Water Reactors Following Extended Power Up-Rates

open_access
Open Access

12. Reliability Based Design of Horizontal Curves Considering the Effects of Grades

open_access
Open Access

13. Reliability and Validity Evidenc for the Confusion, Hubbub, and Order Scale (CHAOS) when used in Rural Homes

open_access
Open Access

14. Sense Of Purpose Inventory: Development, Psychometric examination And Construct Validation

open_access
Open Access

15. Reliability and Aging in Patterned Pb(Zr0.52Ti0.48)O3 Films

open_access
Open Access

16. Generalizability of Direct Behavior Ratings by Trained and Untrained Raters

open_access
Open Access

17. EFFECT OF QUALITY CHARACTERISTICS OF PEER RATER ON THE RELIABILITY AND VALIDITY OF PEER ASSESSMENT

open_access
Open Access

18. ARCHITECTURAL TECHNIQUES TO ENABLE RELIABLE AND HIGH PERFORMANCE MEMORY HIERARCHY IN CHIP MULTI-PROCESSORS

open_access
Open Access

19. Assuring Security and Privacy of Emerging Non-Volatile Memories

open_access
Open Access

20. Reliability Studies in Silicon Carbide and Silicon Power MOSFETs

open_access
Open Access

21. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

open_access
Open Access