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1. THRESHOLDING METHODS FOR HYPOTHESIS TESTING IN HANOVA

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2. The Development and Modeling of a Simulated Test Structure for Rapidly Testing Microelectromechanical Switch Contacts

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3. The global expansion of the testing culture: National testing policies and the reconstruction of education.

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4. Three Dimensional Integrated Circuit Design and Test

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5. Assuring Security and Privacy of Emerging Non-Volatile Memories

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Open Access