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1. Assuring Security and Privacy of Emerging Non-Volatile Memories

open_access
Open Access
Author:
Khan, Mohammad Nasim
Title:
Assuring Security and Privacy of Emerging Non-Volatile Memories
Graduate Program:
Electrical Engineering
Keywords:
Non-Volatile Memory
NVM
Security
Privacy
Reliability
Testing
STTRAM
RRAM
PCM
MRAM
FeRAM
File:
Download Assuring_Security_and_Privacy_of_Emerging_Non_Volatile_Memories__1_.pdf
Committee Members:
Swaroop Ghosh, Dissertation Advisor/Co-Advisor
Mehdi Kiani, Committee Member
Vishal Monga, Committee Member
Trent Ray Jaeger, Committee Member
Saptarshi Das, Outside Member
Kultegin Aydin, Program Head/Chair
Swaroop Ghosh, Committee Chair/Co-Chair

2. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

open_access
Open Access
Author:
Sharov, Fedor
Title:
Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices
Graduate Program:
Engineering Science and Mechanics (PHD)
Keywords:
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects
File:
Download Thesis_FVS_Final_jcm6606_2.pdf
Committee Members:
Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member