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Start Over Graduate Program Electrical Engineering Degree PHD Committee Member Mary Jane Irwin Committee Member Vijaykrishnan Narayanan Keyword analysis Keyword reliability

1. SOFT ERRORS IN LOGIC CIRCUITS: ANALYSIS AND MODELING

open_access
Open Access
Author:
Ramanarayanan, Rajaraman
Title:
SOFT ERRORS IN LOGIC CIRCUITS: ANALYSIS AND MODELING
Graduate Program:
Electrical Engineering
Keywords:
modeling
reliability
logic circuits
soft errors
analysis
File:
Download Thesis_RRSE.pdf
Committee Members:
Vijaykrishnan Narayanan, Committee Chair/Co-Chair
William Kenneth Jenkins, Committee Chair/Co-Chair
Mary Jane Irwin, Committee Member
Charles Lee Croskey, Committee Member
Yuan X Ie, Committee Member
Kenan Unlu, Committee Member

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