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Start Over Year 2007 Keyword Reliability

1. Redundancy and Parallelism Tradeoffs for Reliable, High-Performance Architectures

open_access
Open Access
Author:
Parashar, Angshuman
Title:
Redundancy and Parallelism Tradeoffs for Reliable, High-Performance Architectures
Graduate Program:
Computer Science and Engineering
Keywords:
Transient Faults
Reliability
Microarchitecture
Redundant Threading
File:
Download AngshumanParashar-Dissertation.pdf
Committee Members:
Anand Sivasubramaniam, Committee Chair/Co-Chair
Mary Jane Irwin, Committee Member
Chitaranjan Das, Committee Member
Vijaykrishnan Narayanan, Committee Member
Kenneth Jenkins, Committee Member
Sudhanva Gurumurthi, Committee Member

2. Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs

open_access
Open Access
Author:
Campbell, Jason P
Title:
Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs
Graduate Program:
Engineering Science and Mechanics
Keywords:
Negative Bias Temperature Instability
Spin-Dependent Recombination
Spin-Dependent Tunneling
Atomic-Scale Defects
Reliability
File:
Download Campbell_PhDThesis_Final.pdf
Committee Members:
Patrick M Lenahan, Committee Chair/Co-Chair
S Ashok, Committee Member
Jerzy Ruzyllo, Committee Member
Michael T Lanagan, Committee Member
Tara Krishnan, Committee Member