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Open Access

Author:: Dodda, Akhil
Title:: Novel materials and devices for sensing and security applications
Graduate Program:: Engineering Science and Mechanics (PHD)
Keywords:: Sensing
Security
2D Materials
Internet of Things
In-sensor Compute
File:: Download Thesis.pdf
Committee Members:: Patrick Lenahan, Major Field Member
Mark Horn, Major Field Member
Saptarshi Das, Chair & Dissertation Advisor
Joan Redwing, Outside Unit & Field Member
Albert Segall, Program Head/Chair

Open Access

Author:: Sebastian, Amritanand
Title:: Development of two-dimensional transistors for neuromorphic computing and simulated annealing applications
Graduate Program:: Engineering Science and Mechanics (PHD)
Keywords:: 2D Materials
2D Transistors
Electrochemical Polishing
Device Variation
Probabilistic Neural Network
Bayesian Neural Network
2D Memtransistors
Simulated Annealing
File:: Download PhD_Thesis_A_Sebastian.pdf
Committee Members:: Mauricio Terrones, Outside Unit & Field Member
Osama Awadelkarim, Major Field Member
Patrick Lenahan, Major Field Member
Mark Horn, Major Field Member
Saptarshi Das, Chair & Dissertation Advisor
Albert Segall, Program Head/Chair

Open Access

Author:: Sharov, Fedor
Title:: Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices
Graduate Program:: Engineering Science and Mechanics (PHD)
Keywords:: Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects
File:: Download Thesis_FVS_Final_jcm6606_2.pdf
Committee Members:: Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member

Open Access

Author:: Moxim, Stephen
Title:: Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements
Graduate Program:: Engineering Science and Mechanics (PHD)
Keywords:: Electron Paramagnetic Resonance
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Time-Dependent Dielectric Breakdown
Atomic-Scale Defects
Semiconductor
File:: Download Moxim_Dissertation_Final_Corrected.pdf
Committee Members:: Venkatraman Gopalan, Outside Unit & Field Member
Sahin Ozdemir, Major Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member
Albert Segall, Program Head/Chair

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