Magnetic Resonance Observations of Defects Involved in Bias Temperature Instabilities and Stress Induced Leakage Currents in HfO2 and SiO2 Based Metal-Oxide-Silicon Structures
Patrick M Lenahan, Dissertation Advisor/Co-Advisor Patrick M Lenahan, Committee Chair/Co-Chair Suzanne E Mohney, Committee Member Jerzy Ruzyllo, Committee Member Suman Datta, Committee Member
Digby D Macdonald, Committee Chair/Co-Chair Thomas E Mallouk, Committee Member Long Qing Chen, Committee Member Susan E Trolier Mckinstry, Committee Member
James Hansell Adair, Committee Chair/Co-Chair William Blaine White, Committee Chair/Co-Chair Thomas E Mallouk, Committee Member Erwin A Vogler, Committee Member
Carlo G Pantano, Committee Chair/Co-Chair Elizabeth C Dickey, Committee Member Mark William Horn, Committee Member Paul Voyles, Committee Member Paolo Colombo, Committee Member Joseph Patrick Stitt, Committee Member
Qiming Zhang, Dissertation Advisor/Co-Advisor Qiming Zhang, Committee Chair/Co-Chair Ralph H Colby, Committee Member Qing Wang, Committee Member James Patrick Runt, Committee Member Michael T Lanagan, Committee Member
L Q Chen, Dissertation Advisor/Co-Advisor Long Qing Chen, Committee Chair/Co-Chair Venkatraman Gopalan, Committee Member Zi Kui Liu, Committee Member Peter E Schiffer, Committee Member
Clive A Randall, Committee Chair/Co-Chair James Hansell Adair, Committee Member Leslie Eric Cross, Committee Member Digby D Macdonald, Committee Member Gary Lynn Messing, Committee Member
