1. Developing molecular depth profiling and dynamic imaging with TOF-SIMS and cluster ion beams Open Access Author: Cheng, Juan Title: Developing molecular depth profiling and dynamic imaging with TOF-SIMS and cluster ion beams Graduate Program: Chemistry Keywords: TOF-SIMSmolecular depth profilingcluster ion beams3-d imaging File: Download final_pdf.pdf Committee Members: Nicholas Winograd, Committee Chair/Co-ChairBlake R Peterson, Committee MemberAnne M Andrews, Committee MemberMichael Pishko, Committee Member
2. HIGH PRESSURE CONFINED CHEMICAL VAPOR DEPOSITION OF ELECTRONIC METALATTICES AND SEMICONDUCTORS IN EXTREME GEOMETRIES Open Access Author: Cheng, Hiu Yan Title: HIGH PRESSURE CONFINED CHEMICAL VAPOR DEPOSITION OF ELECTRONIC METALATTICES AND SEMICONDUCTORS IN EXTREME GEOMETRIES Graduate Program: Chemistry Keywords: High PressureChemical Vapor DepositionNanomaterialsSiliconGermaniumMetalattices File: Download Thesis_HiuYanCheng_Final_HPcCVD_Metalattices_C.pdf Committee Members: John V Badding, Dissertation Advisor/Co-AdvisorJohn V Badding, Committee Chair/Co-ChairMiriam Arak Freedman, Committee MemberBenjamin James Lear, Committee MemberVenkatraman Gopalan, Outside Member
