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2. Development of New Atomic Scale Defect Identification Schemes in Micro / Nanoelectronics Incorporating Digital Signal Processing Methods for Investigating Zero/low Field Spin Dependent Transport and Passage Effects in Electrically Detected Magnetic Resonance

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3. MAGNETIC RESONANCE AND MAGNETORESISTANCE FOR THE UNDERSTANDING OF DEFECT CHEMISTRY AND SPIN-TRANSPORT IN AMORPHOUS SEMICONDUCTORS AND DIELECTRICS

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