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1. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

open_access
Open Access
Author:
Sharov, Fedor
Title:
Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices
Graduate Program:
Engineering Science and Mechanics
Keywords:
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects
File:
Download Thesis_FVS_Final_jcm6606_2.pdf
Committee Members:
Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member

2. Synergistic Effects of Radiation and Stress Localization on Wide-Bandgap Semiconductor Devices

open_access
Open Access
Author:
Rasel, Md Abu
Title:
Synergistic Effects of Radiation and Stress Localization on Wide-Bandgap Semiconductor Devices
Graduate Program:
Mechanical Engineering
Keywords:
GaN HEMT
Heavy Ion Irradiation
Proton Irradiation
Gamma Irradiation
In situ Irradiation
In situ Heating
TEM
Electron Wind Force Annealing
File:
Download Thesis_Rasel_review_Final_1.pdf
Committee Members:
Robert Kunz, Professor in Charge/Director of Graduate Studies
Sukwon Choi, Major Field Member
Jing Du, Major Field Member
Md Haque, Chair & Dissertation Advisor
Douglas Wolfe, Dissertation Co-Advisor
Mia Jin, Outside Unit & Field Member