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Author:

Ghosh, Amartya

Title:

Reliability Studies in Silicon Carbide and Silicon Power MOSFETs

Graduate Program:

Engineering Science and Mechanics (PHD)

Keywords:

Wide Band Gap
SiC
Reliability
Device Physics
Interface Traps
Border Traps

File:

Download Final-Revised.pdf

Committee Members:

Samia Suliman, Major Field Member
Jian hsu, Major Field Member
Osama Awadelkarim, Chair & Dissertation Advisor
Jifa Hao, Special Member
Albert Segall, Program Head/Chair
Rongming Chu, Outside Unit & Field Member