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1. Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs

open_access
Open Access
Author:
Campbell, Jason P
Title:
Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs
Graduate Program:
Engineering Science and Mechanics
Keywords:
Negative Bias Temperature Instability
Spin-Dependent Recombination
Spin-Dependent Tunneling
Atomic-Scale Defects
Reliability
File:
Download Campbell_PhDThesis_Final.pdf
Committee Members:
Patrick M Lenahan, Committee Chair/Co-Chair
S Ashok, Committee Member
Jerzy Ruzyllo, Committee Member
Michael T Lanagan, Committee Member
Tara Krishnan, Committee Member

2. Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements

open_access
Open Access
Author:
Moxim, Stephen
Title:
Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements
Graduate Program:
Engineering Science and Mechanics (PHD)
Keywords:
Electron Paramagnetic Resonance
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Time-Dependent Dielectric Breakdown
Atomic-Scale Defects
Semiconductor
File:
Download Moxim_Dissertation_Final_Corrected.pdf
Committee Members:
Venkatraman Gopalan, Outside Unit & Field Member
Sahin Ozdemir, Major Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member
Albert Segall, Program Head/Chair