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Start Over Graduate Program Engineering Science and Mechanics (PHD) Degree PHD Committee Member Suzanne Mohney Keyword Reliability Keyword Reliability

1. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

open_access
Open Access
Author:
Sharov, Fedor
Title:
Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices
Graduate Program:
Engineering Science and Mechanics (PHD)
Keywords:
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects
File:
Download Thesis_FVS_Final_jcm6606_2.pdf
Committee Members:
Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member