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Start Over Graduate Program Engineering Science and Mechanics (PHD) Degree PHD Committee Member Rongming Chu Keyword Reliability Keyword Reliability

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Author:: Ghosh, Amartya
Title:: Reliability Studies in Silicon Carbide and Silicon Power MOSFETs
Graduate Program:: Engineering Science and Mechanics (PHD)
Keywords:: Wide Band Gap
SiC
Reliability
Device Physics
Interface Traps
Border Traps
File:: Download Final-Revised.pdf
Committee Members:: Samia Suliman, Major Field Member
Jian hsu, Major Field Member
Osama Awadelkarim, Chair & Dissertation Advisor
Jifa Hao, Special Member
Albert Segall, Program Head/Chair
Rongming Chu, Outside Unit & Field Member

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