1. Variation Study on Advanced Cmos Systems for Low Voltage Applications Open Access Author: Agrawal, Nidhi Title: Variation Study on Advanced Cmos Systems for Low Voltage Applications Graduate Program: Electrical Engineering Keywords: FinFETTFETLine Edge Roughness (LER)Line Width Roughness (LWR)SRAMRean Static Noise Margin (RSNM)NBTIPBTI File: Download Thesis_Final_Nidhi_Agrawal.pdf Committee Members: Suman Datta, Dissertation Advisor/Co-AdvisorThomas Nelson Jackson, Committee Chair/Co-ChairVijaykrishnan Narayanan, Committee MemberRoman Engel Herbert, Special Member