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Author:

Follman, Jacob Jay

Title:

On the atomic scale defects involved in the negative bias temperature instability in 4H-SiC MOSFETs

Graduate Program:

Materials Science and Engineering

Keywords:

NBTI
SiC
MOSFET
EPR
EDMR

File:

Download Follman_J_MS_Thesis.pdf

Committee Members:

Patrick M Lenahan, Thesis Advisor/Co-Advisor

Author:

Pomorski, Thomas Anthony

Title:

defect structure and electronic transport in low-k films used for back end of line dielectrics

Graduate Program:

Materials Science and Engineering

Keywords:

electronic materials
EPR
low-k
back end of line

File:

Download Pomorski_thesis_final_submission_edits.pdf

Committee Members:

Patrick M Lenahan, Thesis Advisor/Co-Advisor
S Ashok, Thesis Advisor/Co-Advisor
Jerzy Ruzyllo, Thesis Advisor/Co-Advisor
Suzanne E Mohney, Thesis Advisor/Co-Advisor