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Author:

Krishnan, Ramakrishnan

Title:

Analysis of Failures in Nanoscale Devices

Graduate Program:

Electrical Engineering

Keywords:

Reliability

File:

Download Ramakrishnan_Krishnan_Dissertation.pdf

Committee Members:

Vijaykrishnan Narayanan, Dissertation Advisor/Co-Advisor
Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Suman Datta, Committee Chair/Co-Chair
Dr Yuan Xie, Committee Member
Mary Jane Irwin, Committee Member
Kenan Unlu, Committee Member
Ram Mohan Narayanan, Committee Member
Kenneth Jenkins, Committee Member