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Start Over Graduate Program Materials Science and Engineering Year 2010 Committee Member Jerzy Ruzyllo Committee Member Patrick M Lenahan Keyword spin dependent tunneling Keyword stress induced leakage current

1. Magnetic Resonance Observations of Defects Involved in Bias Temperature Instabilities and Stress Induced Leakage Currents in HfO2 and SiO2 Based Metal-Oxide-Silicon Structures

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Open Access
Author:
Ryan, Jason Thomas
Title:
Magnetic Resonance Observations of Defects Involved in Bias Temperature Instabilities and Stress Induced Leakage Currents in HfO2 and SiO2 Based Metal-Oxide-Silicon Structures
Graduate Program:
Materials Science and Engineering
Keywords:
stress induced leakage current
negative bias temperature instabilitiy
electron spin resonance
spin dependent tunneling
magnetic resonance
File:
Download Thesis_V4_Final.pdf
Committee Members:
Patrick M Lenahan, Dissertation Advisor/Co-Advisor
Patrick M Lenahan, Committee Chair/Co-Chair
Suzanne E Mohney, Committee Member
Jerzy Ruzyllo, Committee Member
Suman Datta, Committee Member

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