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Start Over You searched for: Committee Member Hojong Kim Remove constraint Committee Member: Hojong Kim Keyword X-ray diffraction (XRD) Remove constraint Keyword: X-ray diffraction (XRD) Keyword substrate bias Remove constraint Keyword: substrate bias Keyword thermogravimetric analysis (TGA) Remove constraint Keyword: thermogravimetric analysis (TGA) Keyword titanium aluminum nitride (TiAlN) Remove constraint Keyword: titanium aluminum nitride (TiAlN)

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