1. Sub-50 nm Multi-Segment Interconnect Design: A treatise on Speed, Reliability and Signal Integrity Open Access Author: Eze, Melvin Title: Sub-50 nm Multi-Segment Interconnect Design: A treatise on Speed, Reliability and Signal Integrity Graduate Program: Computer Science and Engineering Keywords: InterconnectSignal IntegrityOffset SwitchingVariable Cycle Timing with Temporal RedundancyNBTI File: Download MelvinEze-Dissertation-Final-eTD.pdf Committee Members: Vijaykrishnan Narayanan, Dissertation Advisor/Co-AdvisorVijaykrishnan Narayanan, Committee Chair/Co-ChairMary Jane Irwin, Committee MemberYuan Xie, Committee MemberJerzy Ruzyllo, Special Member