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Author:

Lin, Ing-Chao

Title:

System Level Power and Reliability Modeling

Graduate Program:

Computer Science and Engineering

Keywords:

System-on-Chip
SoC
TLM
Device Degradation Modeling
Power Modeling
Negative Bias Temperature Instability
Hot Carrier Effect
NBTI
Reliability Modeling
HCE
Transaction level modeling
Bus-based
PCI Express

File:

Download ingchao_final.pdf

Committee Members:

Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Mary Jane Irwin, Committee Member
Yuan Xie, Committee Member
W Kenneth Jerkins, Committee Member
Nagu Dhanwada, Committee Member