1. System Level Power and Reliability Modeling Open Access Author: Lin, Ing-Chao Title: System Level Power and Reliability Modeling Graduate Program: Computer Science and Engineering Keywords: System-on-ChipSoCTLMDevice Degradation ModelingPower ModelingNegative Bias Temperature InstabilityHot Carrier EffectNBTIReliability ModelingHCETransaction level modelingBus-basedPCI Express File: Download ingchao_final.pdf Committee Members: Vijaykrishnan Narayanan, Committee Chair/Co-ChairMary Jane Irwin, Committee MemberYuan Xie, Committee MemberW Kenneth Jerkins, Committee MemberNagu Dhanwada, Committee Member