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Start Over Graduate Program Chemistry Year 2010 Keyword cluster ions Keyword molecular depth profiling Keyword ToF-SIMS

1. Fundamental Studies of Molecular Depth Profiling with ToF-SIMS and Cluster Ions

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Open Access
Author:
Lu, Caiyan
Title:
Fundamental Studies of Molecular Depth Profiling with ToF-SIMS and Cluster Ions
Graduate Program:
Chemistry
Keywords:
ToF-SIMS
molecular depth profiling
cluster ions
File:
Download ThesisMaster.pdf
Committee Members:
Nicholas Winograd, Dissertation Advisor/Co-Advisor
Nicholas Winograd, Committee Chair/Co-Chair
Barbara Jane Garrison, Committee Member
Christine Dolan Keating, Committee Member
Qiming Zhang, Committee Member

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