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Author:

Agrawal, Nidhi

Title:

Variation Study on Advanced Cmos Systems for Low Voltage Applications

Graduate Program:

Electrical Engineering

Keywords:

FinFET
TFET
Line Edge Roughness (LER)
Line Width Roughness (LWR)
SRAM
Rean Static Noise Margin (RSNM)
NBTI
PBTI

File:

Download Thesis_Final_Nidhi_Agrawal.pdf

Committee Members:

Suman Datta, Dissertation Advisor/Co-Advisor
Thomas Nelson Jackson, Committee Chair/Co-Chair
Vijaykrishnan Narayanan, Committee Member
Roman Engel Herbert, Special Member