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- Author:
- Follman, Jacob Jay
- Title:
- On the atomic scale defects involved in the negative bias temperature instability in 4H-SiC MOSFETs
- Graduate Program:
- Materials Science and Engineering
- Keywords:
- NBTI
SiC
MOSFET
EPR
EDMR
- File:
- Download Follman_J_MS_Thesis.pdf
- Committee Members:
- Patrick M Lenahan, Thesis Advisor/Co-Advisor
