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Author:

Mao, Dan

Title:

MOLECULAR DEPTH PROFILING AND WEDGE-CRATER BEVELING WITH TOF-SIMS AND CLUSTER ION BEAMS

Graduate Program:

Chemistry

Keywords:

Depth Profiling
Cluster Ion Beams
TOF-SIMS

File:

Download Dan_Thesis.pdf

Committee Members:

Nicholas Winograd, Dissertation Advisor/Co-Advisor
Nicholas Winograd, Committee Chair/Co-Chair
Christine Dolan Keating, Committee Member
Tae Hee Lee, Committee Member
John H Golbeck, Committee Member