1. Reliability and Power Analysis of FinFET-based FPGAs Open Access Author: Mushtaq, Muhammad Umar Title: Reliability and Power Analysis of FinFET-based FPGAs Graduate Program: Computer Science and Engineering Keywords: FPGAFinFETSoft-ErrorProcess VariationsSub-Threshold LeakageIndependent Gate Control File: Download muhammad_umar_mushtaq_thesis.pdf Committee Members: Yuan Xie, Thesis Advisor/Co-Advisor
2. Characterization of Multi-fin Quantum Well Structures using Photo-conductance Decay Technique Open Access Author: Vakil, Apoorva Babu Title: Characterization of Multi-fin Quantum Well Structures using Photo-conductance Decay Technique Graduate Program: Electrical Engineering Keywords: Electrical CharacterizationPhotoconductance DecayFinFETFin sidewalls File: Download thesis_-_Apoorva_Vakil.pdf Committee Members: Jerzy Ruzyllo, Thesis Advisor/Co-Advisor
