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Author:
Follman, Jacob Jay
Title:
On the atomic scale defects involved in the negative bias temperature instability in 4H-SiC MOSFETs
Graduate Program:
Materials Science and Engineering
Keywords:
NBTI SiC MOSFET EPR EDMR
File:
Download Follman_J_MS_Thesis.pdf
Committee Members:
Patrick M Lenahan, Thesis Advisor/Co-Advisor
Author:
Pomorski, Thomas Anthony
Title:
defect structure and electronic transport in low-k films used for back end of line dielectrics
Graduate Program:
Materials Science and Engineering
Keywords:
electronic materials EPR low-k back end of line
File:
Download Pomorski_thesis_final_submission_edits.pdf
Committee Members:
Patrick M Lenahan, Thesis Advisor/Co-Advisor S Ashok, Thesis Advisor/Co-Advisor Jerzy Ruzyllo, Thesis Advisor/Co-Advisor Suzanne E Mohney, Thesis Advisor/Co-Advisor