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Start Over Year 2015 Committee Member Vijaykrishnan Narayanan Keyword Tunneling-field-effect-transistor Keyword soft error reliability

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Author:: Liu, Huichu
Title:: Device Circuit Interactions for Steep Switching Slope Devices
Graduate Program:: Electrical Engineering
Keywords:: Tunneling-field-effect-transistor
device-circuit interaction
steep subthreshold slope
energy efficiency
soft error reliability
File:: Download Ph.D_Thesis_Huichu_Liu-Final_1-12_2.pdf
Committee Members:: Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Suman Datta, Committee Chair/Co-Chair
Jerzy Ruzyllo, Committee Member
Joshua Alexander Robinson, Committee Member

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