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Start Over Graduate Program Electrical Engineering Year 2015 Committee Member Suman Datta Keyword NBTI Keyword NBTI Keyword Line Edge Roughness (LER) Keyword NBTI Keyword Line Edge Roughness (LER)

1. Variation Study on Advanced Cmos Systems for Low Voltage Applications

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Open Access
Author:
Agrawal, Nidhi
Title:
Variation Study on Advanced Cmos Systems for Low Voltage Applications
Graduate Program:
Electrical Engineering
Keywords:
FinFET
TFET
Line Edge Roughness (LER)
Line Width Roughness (LWR)
SRAM
Rean Static Noise Margin (RSNM)
NBTI
PBTI
File:
Download Thesis_Final_Nidhi_Agrawal.pdf
Committee Members:
Suman Datta, Dissertation Advisor/Co-Advisor
Thomas Nelson Jackson, Committee Chair/Co-Chair
Vijaykrishnan Narayanan, Committee Member
Roman Engel Herbert, Special Member

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