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Start Over Committee Member Suman Datta Committee Member Roman Engel Herbert Keyword NBTI Keyword NBTI Keyword Line Edge Roughness (LER)

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Author:: Agrawal, Nidhi
Title:: Variation Study on Advanced Cmos Systems for Low Voltage Applications
Graduate Program:: Electrical Engineering
Keywords:: FinFET
TFET
Line Edge Roughness (LER)
Line Width Roughness (LWR)
SRAM
Rean Static Noise Margin (RSNM)
NBTI
PBTI
File:: Download Thesis_Final_Nidhi_Agrawal.pdf
Committee Members:: Suman Datta, Dissertation Advisor/Co-Advisor
Thomas Nelson Jackson, Committee Chair/Co-Chair
Vijaykrishnan Narayanan, Committee Member
Roman Engel Herbert, Special Member

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