eTD Explore

Start Over Degree PHD Committee Member Mary Jane Irwin Committee Member Kenan Unlu Committee Member Dr Yuan Xie

Open Access

Author:: Krishnan, Ramakrishnan
Title:: Analysis of Failures in Nanoscale Devices
Graduate Program:: Electrical Engineering
Keywords:: Reliability
File:: Download Ramakrishnan_Krishnan_Dissertation.pdf
Committee Members:: Vijaykrishnan Narayanan, Dissertation Advisor/Co-Advisor
Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Suman Datta, Committee Chair/Co-Chair
Dr Yuan Xie, Committee Member
Mary Jane Irwin, Committee Member
Kenan Unlu, Committee Member
Ram Mohan Narayanan, Committee Member
Kenneth Jenkins, Committee Member

Search