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Start Over Committee Member Jerzy Ruzyllo Committee Member Vijaykrishnan Narayanan Keyword soft error reliability Keyword Tunneling-field-effect-transistor Author Last Name Liu

1. Device Circuit Interactions for Steep Switching Slope Devices

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Open Access
Author:
Liu, Huichu
Title:
Device Circuit Interactions for Steep Switching Slope Devices
Graduate Program:
Electrical Engineering
Keywords:
Tunneling-field-effect-transistor
device-circuit interaction
steep subthreshold slope
energy efficiency
soft error reliability
File:
Download Ph.D_Thesis_Huichu_Liu-Final_1-12_2.pdf
Committee Members:
Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Suman Datta, Committee Chair/Co-Chair
Jerzy Ruzyllo, Committee Member
Joshua Alexander Robinson, Committee Member

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