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Keyword
- Electrically Detected Magnetic Resonance2
- Near-Zero-Field Magnetoresistance[remove]2
- Atomic-Scale Defects1
- Electron Paramagnetic Resonance1
- Field Effect Transistors1
- Gamma Irradiation1
- Interface Defects1
- Metal-Oxide-Semiconductors1
- Rapid Scan1
- Reliability1
- Semiconductor1
- Silicon Carbide1
- Silicon Dioxide1
- Time Dependent Dielectric Breakdown1
- Time-Dependent Dielectric Breakdown1
- Total Ionizing Dose1