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Keyword
- Atomic-scale investigations1
- COMSOL simulation1
- Dielectric particles1
- Dielectrophoresis (DEP)[remove]1
- Directed self-assembly1
- Gold nanowire (NW) self-assembly1
- In silico studies1
- Insulator1
- MD simulation1
- Monte Carlo simulation1
- Nanoparticle assembly1
- Oriented Attachment (OA)1
- Rare event sampling1
- Reactive force field (ReaxFF)1
- Semiconductor1
- Surface element integration (SEI)1
- Umbrella sampling1
- insulator1
- semiconductor1
- surface element integration1