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Keyword
- Coulomb blockade1
- Thin film transistor simulation1
- Tunneling-field-effect-transistor1
- device-circuit interaction1
- energy efficiency1
- low power1
- multi-gate1
- non-volatile1
- oxide TFT simulation1
- oxide TFTs1
- oxide semiconductor traps.1
- oxide thin film transistor1
- quantum well FET1
- single electron1
- soft error reliability1
- steep subthreshold slope1