SPECTROSCOPIC CHARACTERIZATION OF THIN FILM SEMICONDUCTING MATERIALS

Open Access
Author:
Larsen, Alec Von
Graduate Program:
Chemistry
Degree:
Master of Science
Document Type:
Master Thesis
Date of Defense:
April 04, 2016
Committee Members:
  • John B Asbury, Thesis Advisor
  • Mark Maroncelli, Thesis Advisor
  • Tom Mallouk, Thesis Advisor
Keywords:
  • Perovskite
  • Spectroscopy
  • XRD
  • Ultra-Fast
  • Pump Probe
  • Transient Absorption
Abstract:
The detailed characterization of thin films for use in semiconducting photovoltaic devices is critical in assisting the development of novel materials and processing conditions. Following the characterization of thin films in organo-halide perovskites, our results provide useful information to the scientific community about charge carrier recombination centers and their preferential formation on surface and grain boundaries. This information identifies key details that contradict the field’s assumptions about the innocence of grain boundaries in the perovskite films. To provide a more complete understanding of the photophysics of materials, photothermal deflection spectroscopy was developed in our lab. The use of a solid deflecting medium provided a novel means of investigating optical absorption and non-radiative decay of excited states. Upon completion, this experimental technique provided critical information for the development of a novel spectroscopy, ultra-fast photo thermal deflection spectroscopy.