Magnetic Resonance Observations of Defects Involved in Bias Temperature Instabilities and Stress Induced Leakage Currents in HfO2 and SiO2 Based Metal-Oxide-Silicon Structures
Patrick M Lenahan, Dissertation Advisor/Co-Advisor Patrick M Lenahan, Committee Chair/Co-Chair Suzanne E Mohney, Committee Member Jerzy Ruzyllo, Committee Member Suman Datta, Committee Member
