1. A novel AFM technique for simultaneous non-contact imaging of topography and surface potential in solution Open Access Author: Marchand, David Joseph Title: A novel AFM technique for simultaneous non-contact imaging of topography and surface potential in solution Graduate Program: Chemical Engineering Keywords: scanning polarization force microscopynon-contact imagingatomic force microscopeelectrostatic actuation File: Download MS_Thesis_FINAL1.pdf Committee Members: Seong Han Kim, Thesis Advisor/Co-AdvisorSeong H Kim, Thesis Advisor/Co-Advisor
