Development of New Atomic Scale Defect Identification Schemes in Micro / Nanoelectronics Incorporating Digital Signal Processing Methods for Investigating Zero/low Field Spin Dependent Transport and Passage Effects in Electrically Detected Magnetic Resonance
Patrick M. Lenahan, Dissertation Advisor/Co-Advisor Patrick M. Lenahan, Committee Chair/Co-Chair Mark Horn, Committee Member S. Ashok, Committee Member Jerzy Ruzyllo, Outside Member