1. RELIABILITY STUDIES OF LOW-VOLTAGE, PLANAR, POWER MOSFET DEVICES Open Access Author: Moses, James Michael Title: RELIABILITY STUDIES OF LOW-VOLTAGE, PLANAR, POWER MOSFET DEVICES Graduate Program: Engineering Science Keywords: transistorshot carrier stressdegradationcharge pumpingdynamic analysis of MOSFET File: Download Thesis_Report_Moses_Rev3.pdf Committee Members: Samia A Suliman, Thesis Advisor/Co-AdvisorSamia A Suliman, Thesis Advisor/Co-Advisor
