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Author:

Passmore, Lucas Jay

Title:

Development of a Complimentary Suite of Characterization Tools for the Analysis of MOS Device Degradation Using Dynamic Stimuli

Graduate Program:

Engineering Science and Mechanics

Keywords:

semiconductor
pca
health monitoring
mosfet
reliability
mos
dynamic

File:

Download Passmore_Dissertation.pdf

Committee Members:

Osama O Awadelkarim, Dissertation Advisor/Co-Advisor
Osama O Awadelkarim, Committee Chair/Co-Chair
Joseph Paul Cusumano, Committee Chair/Co-Chair
Samia A Suliman, Committee Member
Jerzy Ruzyllo, Committee Member