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Author:

Billman, Curtis A

Title:

ELECTRICAL CHARACTERIZATION OF THE EPITAXIAL INTERFACE BETWEEN Ba0.7Sr0.3O AND SILICON

Graduate Program:

Materials Science and Engineering

Keywords:

epitaxial interface
conductance technique
in situ probe station

File:

Download Billman_Thesis.pdf

Committee Members:

Darrell Schlom, Committee Chair/Co-Chair
Suzanne E Mohney, Committee Member
Jerzy Ruzyllo, Committee Member
Susan E Trolier Mckinstry, Committee Member
Fredrick Walker, Committee Member