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1. PHASE DIAGRAMS FOR GUIDING SILICON THIN FILM DEPOSITION IN PHOTOVOLTAICS APPLICATIONS AS DERIVED BY REAL TIME SPECTROSCOPIC ELLIPSOMETRY

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3. Optical and Electrical Characterization of High Resistivity Semiconductors for Constant-bias Microbolometer Devices

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4. Change in bond parameters & induced stress in the alteration layer of corroded boro-aluminosilicate glass revealed by structural analysis

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Open Access