Development of New Atomic Scale Defect Identification Schemes in Micro / Nanoelectronics Incorporating Digital Signal Processing Methods for Investigating Zero/low Field Spin Dependent Transport and Passage Effects in Electrically Detected Magnetic Resonance
Tom Jackson, Major Field Member Noel Giebink, Chair & Dissertation Advisor Mehdi Kiani, Major Field Member Madhavan Swaminathan, Program Head/Chair John Asbury, Outside Unit & Field Member