1. Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements Open Access Author: Moxim, Stephen Title: Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements Graduate Program: Engineering Science and Mechanics Keywords: Electron Paramagnetic ResonanceElectrically Detected Magnetic ResonanceNear-Zero-Field MagnetoresistanceTime-Dependent Dielectric BreakdownAtomic-Scale DefectsSemiconductor File: Download Moxim_Dissertation_Final_Corrected.pdf Committee Members: Venkatraman Gopalan, Outside Unit & Field MemberSahin Ozdemir, Major Field MemberPatrick Lenahan, Chair & Dissertation AdvisorSaptarshi Das, Major Field MemberAlbert Segall, Program Head/Chair
