1. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices Open Access Author: Sharov, Fedor Title: Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices Graduate Program: Engineering Science and Mechanics Keywords: Electrically Detected Magnetic ResonanceNear-Zero-Field MagnetoresistanceReliabilityMetal-Oxide-SemiconductorsField Effect TransistorsTime Dependent Dielectric BreakdownGamma IrradiationTotal Ionizing DoseSilicon DioxideSilicon CarbideRapid ScanInterface Defects File: Download Thesis_FVS_Final_jcm6606_2.pdf Committee Members: Albert Segall, Program Head/ChairSahin Ozdemir, Major Field MemberSuzanne Mohney, Outside Unit & Field MemberPatrick Lenahan, Chair & Dissertation AdvisorSaptarshi Das, Major Field Member
