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Author:

Eichfeld, Devon

Title:

Development of a New Sub-Micron Metrology Technique and Optimization of Thermal Rectifier Design using Novel Materials

Graduate Program:

Mechanical Engineering (PHD)

Keywords:

Atomic force microscopy
Thermal Rectification
Metalattice
Optical pump-probe

File:

Download Eichfeld_Dissertation_Final.pdf

Committee Members:

Robert Kunz, Professor in Charge/Director of Graduate Studies
Sukwon Choi, Major Field Member
Ismaila Dabo, Outside Unit Member
Joshua Robinson, Outside Field Member
Venkatraman Gopalan, Outside Field Member
Bladimir Ramos Alvarado, Chair & Dissertation Advisor