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Author:

Mc Crory, Duane

Title:

Magnetic Resonance in a Wafer Probing Station

Graduate Program:

Engineering Science and Mechanics

Keywords:

Electrically Detected Magnetic Resonance
Semiconductors
Semiconductor Reliability
Rapid Scan EDMR
Spatially Resolved EDMR
Electrically Detected Electron Nuclear Double Resonance

File:

Download McCrory_PhD_Thesis_FINAL.pdf

Committee Members:

Patrick M Lenahan, Dissertation Advisor/Co-Advisor
Patrick M Lenahan, Committee Chair/Co-Chair
Jerzy Ruzyllo, Committee Member
Saptarshi Das, Committee Member
Michael T Lanagan, Outside Member