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1. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

open_access
Open Access
Author:
Sharov, Fedor
Title:
Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices
Graduate Program:
Engineering Science and Mechanics
Keywords:
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects
File:
Download Thesis_FVS_Final_jcm6606_2.pdf
Committee Members:
Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member

2. Novel Techniques and Modern Applications of Electrically Detected Magnetic Resonance Spectroscopy and Near-Zero-Field Magnetoresistance

open_access
Open Access
Author:
Myers, Kenneth
Title:
Novel Techniques and Modern Applications of Electrically Detected Magnetic Resonance Spectroscopy and Near-Zero-Field Magnetoresistance
Graduate Program:
Materials Science and Engineering
Keywords:
Semiconductors
Electrically Detected Magnetic Resonance
Near Zero Field Magnetoresistance
Electron Paramagnetic Resonance
Electron Nuclear Double Resonance
Deep Level Transient Spectroscopy
Silicon
Silicon Dioxide
Negative Bias Temperature Instability
FinFET
Hafnium Dioxide
Amorphous Boron
File:
Download Kenneth_Myers_Thesis_Final4.pdf
Committee Members:
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Mark Horn, Major Field Member
Saptarshi Das, Major Field Member
John Mauro, Program Head/Chair